Revealing the origin of high-thermal-stability of single-crystal Ni-rich cathodes toward higher-safety batteries
Nano Energy, ISSN: 2211-2855, Vol: 116, Page: 108846
2023
- 32Citations
- 15Captures
- 1Mentions
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Most Recent News
Findings in the Area of Chemicals and Chemistry Reported from China University of Petroleum (East China) (Revealing the Origin of High-thermal-stability of Single-crystal Ni-rich Cathodes Toward Higher-safety Batteries)
2023 NOV 02 (NewsRx) -- By a News Reporter-Staff News Editor at Chemicals & Chemistry Daily Daily -- Research findings on Chemicals and Chemistry are
Article Description
The poor thermal stability of Ni-rich cathode materials, resulting in thermal runaway of the battery, is a major safety threat to the development of lithium-ion batteries. However, the thermal degradation mechanism that determines thermal stability, especially for the promising single-crystal (SC) Ni-rich cathode material, has not been elucidated. More importantly, this is indeed a fundamental issue. Herein, via a series of in-situ/ex-situ probing technologies, the thermal degradation of SC Ni-rich material is elaborately diagnosed from surface to bulk phase and compared with polycrystalline (PC) Ni-rich material. A comprehensive oxygen release kinetic model including oxygen diffusion distance, mechanical stress and temperature is presented. This model reveals that the SC Ni-rich material exhibits a stable depth-dependent gradient oxygen release kinetics, while the PC Ni-rich material exhibits an accelerated oxygen release kinetics by grain boundaries, which reveals the origin of the high-thermal-stability of SC Ni-rich cathodes. This work highlights the importance of suppressing oxygen release kinetics (e.g., increase oxygen diffusion distance, increase mechanical stress) to improve thermal stability, facilitating the development of safer lithium-ion batteries based on Ni-rich cathodes.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S2211285523006833; http://dx.doi.org/10.1016/j.nanoen.2023.108846; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85169929080&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S2211285523006833; https://dx.doi.org/10.1016/j.nanoen.2023.108846
Elsevier BV
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