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380 keV proton irradiation effects on photoluminescence of Eu-doped GaN

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, ISSN: 0168-583X, Vol: 266, Issue: 5, Page: 853-856
2008
  • 9
    Citations
  • 0
    Usage
  • 10
    Captures
  • 0
    Mentions
  • 0
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Metrics Details

  • Citations
    9
    • Citation Indexes
      9
  • Captures
    10

Article Description

The effect of 380 keV proton irradiation on the photoluminescence (PL) properties has been investigated for undoped and Eu-doped GaN. As the proton irradiation exceeds 1×1013cm-2, a drastic decrease of PL intensity of the near band-edge emission of undoped GaN was observed. On the other hand, for Eu-doped GaN, the PL emission corresponding to the 5D0→7F2 transition in Eu3+ kept the initial PL intensity after the proton irradiation up to 1×1014cm-2. Present results, together with our previous report on electron irradiation results, suggest that Eu-doped GaN is a strong candidate for light emitting devices in high irradiation environment.

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