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Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure

Physica B: Condensed Matter, ISSN: 0921-4526, Vol: 403, Issue: 10, Page: 1719-1722
2008
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Article Description

By using the Franz–Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.

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