Disassociation of excitons in MEH-PPV layer under high electric field based on solid-state cathodoluminescence (SSCL) structure
Physica B: Condensed Matter, ISSN: 0921-4526, Vol: 403, Issue: 10, Page: 1719-1722
2008
- 11Captures
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Metrics Details
- Captures11
- Readers11
- 11
Article Description
By using the Franz–Keldysh model, the disassociation probability of poly[2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene vinylene] (MEH-PPV) excitons within the ordinary field strength range was calculated based on solid-state cathodoluminescence (SSCL) structure. It can be inferred that the disassociation probability of MEH-PPV excitons increases with increasing the applied voltage and it becomes more favorable to blue emission with higher applied voltage.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0921452607008654; http://dx.doi.org/10.1016/j.physb.2007.09.095; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=40949143664&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S0921452607008654; https://api.elsevier.com/content/article/PII:S0921452607008654?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0921452607008654?httpAccept=text/plain; https://dx.doi.org/10.1016/j.physb.2007.09.095
Elsevier BV
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