Influence of charge carriers on corrugation of suspended graphene
Solid State Communications, ISSN: 0038-1098, Vol: 270, Page: 1-5
2018
- 8Captures
- 1Mentions
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Captures8
- Readers8
- Mentions1
- Blog Mentions1
- Blog1
Article Description
Electronic degrees of freedom are predicted to play a significant role in mechanics of two-dimensional crystalline membranes. Here we show that appearance of charge carriers may cause a considerable impact on suspended graphene corrugation, thus leading to additional mechanism resulting in charge carriers mobility variation with their density. This finding may account for some details of suspended graphene conductivity dependence on its doping level and suggests that proper modeling of suspended graphene-based device properties must include the influence of charge carriers on its surface corrugation.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0038109817303587; http://dx.doi.org/10.1016/j.ssc.2017.11.003; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85034050523&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S0038109817303587; https://dx.doi.org/10.1016/j.ssc.2017.11.003
Elsevier BV
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