On the spatial resolution of uncoated optical-fiber probes in internal reflection near-field scanning optical microscopy
Ultramicroscopy, ISSN: 0304-3991, Vol: 71, Issue: 1, Page: 379-382
1998
- 8Citations
- 3Captures
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Article Description
We present conclusive experimental quantitative evidence of the resolution limit of uncoated optical fiber probes in the internal reflection mode. Additionally, we present a new technique for unambiguously determining the resolution of a near-field scanning optical microscope without topographical influences. A sample with nearly no topography but with a large dielectric step junction was created by evaporating a thin chromium layer on a silicon wafer and subsequently cleaving the wafer. The cleaved edge is then scanned over the step junction, allowing a quantitative determination of the lateral resolution without topographical influences.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0304399197000909; http://dx.doi.org/10.1016/s0304-3991(97)00090-9; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0032033815&origin=inward; http://linkinghub.elsevier.com/retrieve/pii/S0304399197000909; http://api.elsevier.com/content/article/PII:S0304399197000909?httpAccept=text/xml; http://api.elsevier.com/content/article/PII:S0304399197000909?httpAccept=text/plain; https://linkinghub.elsevier.com/retrieve/pii/S0304399197000909; https://api.elsevier.com/content/article/PII:S0304399197000909?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0304399197000909?httpAccept=text/plain; http://dx.doi.org/10.1016/s0304-3991%2897%2900090-9; https://dx.doi.org/10.1016/s0304-3991%2897%2900090-9
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