The electron beam technique in carbon monoxide
Journal of Electron Spectroscopy and Related Phenomena, ISSN: 0368-2048, Vol: 105, Issue: 2, Page: 239-244
1999
- 3Citations
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations3
- Citation Indexes3
- CrossRef3
Article Description
Electron-induced emissions of the First Negative System of CO + were studied in CO and Ar+CO(10%) free jets. The mechanisms of the excitation–emission process were analysed to make use of the electron beam technique in CO as well as in a CO+Ar mixture. It was shown that more than 85% of the (0,0) band emission was excited by primary electrons. Rate constants of collisional quenching of the CO + (B) state by CO and Ar were measured at low (<200 K) temperatures. The negative temperature dependence of the quenching rates is in qualitative agreement with the results obtained for other molecular ions.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0368204899000626; http://dx.doi.org/10.1016/s0368-2048(99)00062-6; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0001630823&origin=inward; http://linkinghub.elsevier.com/retrieve/pii/S0368204899000626; http://api.elsevier.com/content/article/PII:S0368204899000626?httpAccept=text/xml; http://api.elsevier.com/content/article/PII:S0368204899000626?httpAccept=text/plain; https://linkinghub.elsevier.com/retrieve/pii/S0368204899000626; http://dx.doi.org/10.1016/s0368-2048%2899%2900062-6; https://dx.doi.org/10.1016/s0368-2048%2899%2900062-6
Elsevier BV
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