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Structural and magnetic properties of ion beam sputtered NiMnSb films

Physica B: Condensed Matter, ISSN: 0921-4526, Vol: 248, Issue: 1, Page: 140-145
1998
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Article Description

In this work the structural and magnetic properties of NiMnSb (NMS)-films deposited at different temperatures were investigated to determine optimal sample preparation conditions. Films of NMS were sputtered from a composite target onto heated (150–300°C) Si(1 0 0) and MgO(1 0 0) substrates. The crystal structure was characterized by high angle X -ray diffraction, and polycrystalline samples with the typical C1 b structure were found for higher deposition temperatures. The roughness of the growth surface was investigated by X-ray reflectivity and X-ray diffuse scattering measurements. It was found to range from 13 to 60 Å depending on the deposition temperature. Magnetization measurements confirmed ferromagnetic layers with a strong dependence of the coercive field on the deposition temperature. The saturation moments were found to be affected by deposition temperature and in all cases less than 2.5 μ B per Mn-site.

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