PlumX Metrics
Embed PlumX Metrics

Material Contrast of Scanning Electron and Ion Microscope Images of Metals

Microscopy Today, ISSN: 1551-9295, Vol: 16, Issue: 1, Page: 6-11
2008
  • 2
    Citations
  • 0
    Usage
  • 4
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    2
    • Citation Indexes
      2
      • CrossRef
        2
  • Captures
    4

Article Description

Microscopy Today

Bibliographic Details

T Suzuki; M Kudo; Y Sakai; T Ichinokawa

Oxford University Press (OUP)

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know