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Surface chemistry of mercaptan and growth of pyridine short-chain alkoxy silane molecular layers

Langmuir, ISSN: 0743-7463, Vol: 18, Issue: 5, Page: 1587-1594
2002
  • 63
    Citations
  • 0
    Usage
  • 63
    Captures
  • 1
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

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  • Citations
    63
    • Citation Indexes
      63
  • Captures
    63
  • Mentions
    1
    • References
      1
      • Wikipedia
        1

Article Description

The use of molecular layers to modify the surface and interfaces of solid-state materials while retaining their bulk properties offers great potential. Despite the widespread interest, little work has been undertaken to characterize the growth and surface chemistry of the short-chain alkoxy silane molecular layers. Variable angle spectroscopic ellipsometry, contact angle goniometry, and X-ray photoelectron spectroscopy are used to undertake the work in the present study. Results indicate that 3-mercaptopropyltrimethoxysilane and 2-(trimethoxysilylethyl)pyridine are both unique among the short-chain alkoxy silanes and grow multilayer films in a toluene solution on hydroxylated SiO surfaces. In particular, the mercaptan molecular layers show evidence of a changing surface chemistry as a function of growth time. Further, added surface moisture on mercaptan molecular layers yields thicker films of a higher density with more reduced surface sulfur when subsequent growth is resumed as compared to a control sample. Further, the pyridine molecular layers possess negative optical birefringence much like the parylene polymers, polyimides, and phthalocyanine Langmuir-Blodgett films undertaken by previous researchers. In previous cases, the presence of a phenyl group with a large anisotropic molecular polarizability caused the large in-plane polarizability. Further, the pyridine molecular layers exhibited a high index of refraction of 1.567 ± 0.005 explaining its superior properties as a metallic diffusion barrier at dielectric/metal interfaces from previous research.

Bibliographic Details

Jay J. Senkevich; Christopher J. Mitchell; G. R. Yang; T. M. Lu

American Chemical Society (ACS)

Materials Science; Physics and Astronomy; Chemistry

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