Characterizing the metal-SAM interface in tunneling junctions
ACS Nano, ISSN: 1936-086X, Vol: 9, Issue: 2, Page: 1471-1477
2015
- 40Citations
- 107Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations40
- Citation Indexes40
- 40
- CrossRef36
- Captures107
- Readers107
- 107
Article Description
This paper investigates the influence of the interface between a gold or silver metal electrode and an n-alkyl SAM (supported on that electrode) on the rate of charge transport across junctions with structure Met(Au or Ag)/A(CH)H//GaO/EGaIn by comparing measurements of current density, J(V), for Met/AR = Au/thiolate (Au/SR), Ag/thiolate (Ag/SR), Ag/carboxylate (Ag/OCR), and Au/acetylene (Au/C≡CR), where R is an n-alkyl group. Values of Jand β (from the Simmons equation) were indistinguishable for these four interfaces. Since the anchoring groups, A, have large differences in their physical and electronic properties, the observation that they are indistinguishable in their influence on the injection current, J(V = 0.5) indicates that these four Met/A interfaces do not contribute to the shape of the tunneling barrier in a way that influences J(V).
Bibliographic Details
American Chemical Society (ACS)
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