Universal three-dimensional crosslinker for all-photopatterned electronics
Nature Communications, ISSN: 2041-1723, Vol: 11, Issue: 1, Page: 1520
2020
- 96Citations
- 85Captures
- 4Mentions
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations96
- Citation Indexes96
- 96
- CrossRef30
- Captures85
- Readers85
- 85
- Mentions4
- News Mentions3
- 3
- Blog Mentions1
- 1
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Most Recent News
Universal three-dimensional crosslinker for all-photopatterned electronics
A research team, affiliated with South Korea's Ulsan National Institute of Science and Technology (UNIST) has succeeded in fabricating highly integrated arrays of PTFTs and logic gates via all-solution processing.
Article Description
All-solution processing of large-area organic electronics requires multiple steps of patterning and stacking of various device components. Here, we report the fabrication of highly integrated arrays of polymer thin-film transistors and logic gates entirely through a series of solution processes. The fabrication is done using a three-dimensional crosslinker in tetrahedral geometry containing four photocrosslinkable azide moieties, referred to as 4Bx. 4Bx can be mixed with a variety of solution-processable electronic materials (polymer semiconductors, polymer insulators, and metal nanoparticles) and generate crosslinked network under exposure to UV. Fully crosslinked network film can be formed even at an unprecedentedly small loading, which enables preserving the inherent electrical and structural characteristics of host material. Because the crosslinked electronic component layers are strongly resistant to chemical solvents, micropatterning the layers at high resolution as well as stacking the layers on top of each other by series of solution processing steps is possible.
Bibliographic Details
Springer Science and Business Media LLC
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