Identification of structural defects in graphitic materials by gas-phase anisotropic etching
Nanoscale, ISSN: 2040-3372, Vol: 4, Issue: 6, Page: 2005-2009
2012
- 39Citations
- 62Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Metrics Details
- Citations39
- Citation Indexes39
- 39
- CrossRef37
- Captures62
- Readers62
- 62
Article Description
We developed a method of identifying the structural defects in graphitic materials by an anisotropic etching technique. Intrinsic and oxygen- or argon- plasma induced artificial defects' density and domain size can be obtained easily and precisely. It was inferred, through our investigations, that the grade ZYA highly oriented pyrolytic graphite (HOPG) sample has a better crystal quality, with a lower defect density, while the Kish graphite has a larger grain size and higher defect density. Defect types and lattice orientations can also be extracted by this technique. Furthermore, this method could apply to various graphitic materials including graphene. © The Royal Society of Chemistry 2012.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84857818729&origin=inward; http://dx.doi.org/10.1039/c2nr11707j; http://www.ncbi.nlm.nih.gov/pubmed/22318671; https://xlink.rsc.org/?DOI=c2nr11707j; https://dx.doi.org/10.1039/c2nr11707j; https://pubs.rsc.org/en/content/articlelanding/2012/nr/c2nr11707j
Royal Society of Chemistry (RSC)
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