Moisture effects on the electrochemical reaction and resistance switching at Ag/molybdenum oxide interfaces
Physical Chemistry Chemical Physics, ISSN: 1463-9076, Vol: 18, Issue: 18, Page: 12466-12475
2016
- 48Citations
- 39Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Metrics Details
- Citations48
- Citation Indexes48
- 48
- CrossRef46
- Captures39
- Readers39
- 39
Article Description
An important potential application of solid state electrochemical reactions is in redox-based resistive switching memory devices. Based on the fundamental switching mechanisms, the memory has been classified into two modes, electrochemical metallization memory (ECM) and valence change memory (VCM). In this work, we have investigated a solid state electrochemical cell with a simple Ag/MoO/fluorine-doped tin oxide (FTO) sandwich structure, which shows a normal ECM switching mode after an electroforming process. While in the lower voltage sweep range, the switching behavior changes to VCM-like mode with the opposite switching polarity to the ECM mode. By current-voltage measurements under different ambient atmospheres and X-ray photoemission spectroscopy analysis, electrochemical anodic passivation of the Ag electrode and valence change of molybdenum ions during resistance switching have been demonstrated. The crucial role of moisture adsorption in the switching mode transition has been clarified based on the Pourbaix diagram for the Ag-HO system for the first time. These results provide a fundamental insight into the resistance switching mechanism model in solid state electrochemical cells.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84973533399&origin=inward; http://dx.doi.org/10.1039/c6cp00823b; http://www.ncbi.nlm.nih.gov/pubmed/26996952; http://xlink.rsc.org/?DOI=C6CP00823B; http://pubs.rsc.org/en/content/articlepdf/2016/CP/C6CP00823B; https://xlink.rsc.org/?DOI=C6CP00823B; https://dx.doi.org/10.1039/c6cp00823b; https://pubs.rsc.org/en/content/articlelanding/2016/cp/c6cp00823b
Royal Society of Chemistry (RSC)
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