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A differential extended gate-AlGaN/GaN HEMT sensor for real-time detection of ionic pollutants

Analytical Methods, ISSN: 1759-9679, Vol: 11, Issue: 31, Page: 3981-3986
2019
  • 21
    Citations
  • 0
    Usage
  • 21
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    21
    • Citation Indexes
      21
  • Captures
    21

Article Description

In this study, we propose a differential extended gate (DEG)-AlGaN/GaN high electron mobility transistor (HEMT) sensor to detect ionic pollutants in solution. The DEG-AlGaN/GaN HEMT sensor consists of two extended gate sensing units, which combine the differential method with the extended gate structure. Ionic pollutant Fe is used to test the feasibility of the device. Compared to the conventional AlGaN/GaN HEMT sensor, DEG-AlGaN/GaN HEMT sensors can effectively reduce the effect of noise factors and successfully improve the detection limit to 10 fM. At the same time, the DEG sensor shows that Fe can be detected in a wide range of concentrations, varying from 10 fM to 100 μM, and it shows better linearity (R = 0.9955) than the conventional AlGaN/GaN HEMT sensor. These results demonstrate that the unique DEG design can overcome the drawbacks of the conventional AlGaN/GaN HEMT sensor, and significantly improve the overall performance of the AlGaN/GaN HEMT sensor. As a result, this novel sensor has the potential to be a real-time and high-performance test tool for environmental monitoring.

Bibliographic Details

Lei Zhao; Xinsheng Liu; Bin Zeng; Bin Miao; Zhiqi Gu; Jin Wang; Huo Xiang Peng; Jiadong Li; Jian Zhang

Royal Society of Chemistry (RSC)

Chemistry; Chemical Engineering; Engineering

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