PlumX Metrics
Embed PlumX Metrics

Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy

Journal of Materials Chemistry C, ISSN: 2050-7526, Vol: 8, Issue: 46, Page: 16513-16519
2020
  • 33
    Citations
  • 0
    Usage
  • 45
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    33
    • Citation Indexes
      33
  • Captures
    45

Article Description

The enhancement factor (EF) is an essential parameter in the field of surface-enhanced Raman spectroscopy (SERS), indicating the magnification of the Raman signal of molecules interacting with the surface of plasmonic nanostructures. The calculation of EF requires a careful evaluation of both the signal intensities and the number of molecules in SERS and normal Raman conditions. The determination of the surface density of molecules adsorbed on the plasmonic substrate is a challenging task, but essential for the estimation of the number of SERS-active molecules. This paper describes the determination of EF using 7-mercapto-4-methylcoumarin (MMC) as the probe molecule on gold-coated silicon nanowires, integrating SERS and normal Raman spectroscopy with X-ray fluorescence (RF-XRF) data that provide a reference-free quantitative measurement of the molecular surface density. In addition, the surface coverage of MMC on the substrate is modelled by molecular mechanics (MM) and molecular dynamics (MD) simulations.

Bibliographic Details

Eleonora Cara; Luisa Mandrile; Alessio Sacco; Andrea M. Giovannozzi; Andrea M. Rossi; Federica Celegato; Natascia De Leo; Luca Boarino; Federico Ferrarese Lupi; Philipp Hönicke; Yves Kayser; Burkhard Beckhoff; Davide Marchi; Alberto Zoccante; Maurizio Cossi; Michele Laus

Royal Society of Chemistry (RSC)

Chemistry; Materials Science

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know