Highly efficient and ultra-stable CsPbBr composites for LCD devices and X-ray imaging
Journal of Materials Chemistry C, ISSN: 2050-7534, Vol: 12, Issue: 10, Page: 3465-3473
2024
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Achieving excellent optical properties and stability is crucial for the practical utilization of perovskite emitters. Herein, ultra-stable CsPbBr-DPSI/MS composites with a high photoluminescence quantum yield (PLQY) of 93.2% are obtained through passivation of the surface of CsPbBr quantum dots (QDs) by 3-(decyldimethylammonio)-propane-sulfonate inner salt (DPSI) and encapsulating these QDs using silica molecular sieve (MS) templates. After aging for 1000 hours under harsh synergistic conditions (i.e., temperature of 60 °C, relative humidity of 90%, and blue light irradiation with a power density of 3500 W m), these composites still retain 90% of their initial photoluminescence (PL) intensity. To the best of our knowledge, these CsPbBr-DPSI/MS composites represent the most stable CsPbBr emitters in an accelerated aging test under these synergistic humidity-heat-light conditions. The liquid crystal display (LCD) backlight module utilizing these stable composites shows a wide color gamut of 111.7% NTSC. Furthermore, these CsPbBr-DPSI/MS composites exhibit exceptional X-ray scintillator performance and impressive radiation hardness, delivering a high X-ray imaging spatial resolution of up to ≈16 lp mm and a low detection limit of 339 nGy s
Bibliographic Details
Royal Society of Chemistry (RSC)
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