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Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence

Journal de Physique III, ISSN: 1155-4320, Vol: 4, Issue: 9, Page: 1559-1564
1994
  • 7
    Citations
  • 0
    Usage
  • 5
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    7
    • Citation Indexes
      7
      • CrossRef
        7
  • Captures
    5

Article Description

Journal de Physique III

Bibliographic Details

D.K.G. de Boer; A. J.G. Leenaers; W.W. van den Hoogenhof

EDP Sciences

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