X-ray photoemission characterization of thin epitaxial Fe silicide phases on Si(111)
Applied Physics Letters, ISSN: 0003-6951, Vol: 63, Issue: 17, Page: 2360-2362
1993
- 14Citations
- 4Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Depending on preparation conditions, Fe silicides grown on Si(111) by means of solid phase epitaxy and molecular beam epitaxy show the formation of the bulk ε-FeSi and β-FeSi phases as well as epitaxially grown metastable CsCl- and CaF-type Fe silicides. The valence-band of these Fe silicides are measured with monochromatized Al Kα x-ray photoemission and angle resolved ultraviolet photoemission and are found to be in remarkable agreement with calculated densities of states.
Bibliographic Details
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know