An adaptive scan generator for a scanning tunneling microscope
Review of Scientific Instruments, ISSN: 0034-6748, Vol: 65, Issue: 1, Page: 89-92
1994
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Article Description
A novel scan generator for a scanning tunneling microscope (STM) has been developed. The instrument compares tunneling current with three thresholds values, to generate an x-scanner signal with a dynamically changeable step size for adaptation to sharp topographical changes. It has two advantages compared to conventional STM scan generators (i) a better protection from a tip crash and (ii) minimization of the image acquisition time. The implementation is made with a digital signal processor (DSP) DSP32C from AT&T, mounted on a commercially available PC AT-compatible plug-in card. Test images of extremely rough surfaces confirm the usefulness of our novel scan generator. The concept could also be used for different scanning probe microscopes.
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