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An adaptive scan generator for a scanning tunneling microscope

Review of Scientific Instruments, ISSN: 0034-6748, Vol: 65, Issue: 1, Page: 89-92
1994
  • 13
    Citations
  • 0
    Usage
  • 3
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    13
    • Citation Indexes
      13
  • Captures
    3

Article Description

A novel scan generator for a scanning tunneling microscope (STM) has been developed. The instrument compares tunneling current with three thresholds values, to generate an x-scanner signal with a dynamically changeable step size for adaptation to sharp topographical changes. It has two advantages compared to conventional STM scan generators (i) a better protection from a tip crash and (ii) minimization of the image acquisition time. The implementation is made with a digital signal processor (DSP) DSP32C from AT&T, mounted on a commercially available PC AT-compatible plug-in card. Test images of extremely rough surfaces confirm the usefulness of our novel scan generator. The concept could also be used for different scanning probe microscopes.

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