A shear force feedback control system for near-field scanning optical microscopes without lock-in detection
Review of Scientific Instruments, ISSN: 0034-6748, Vol: 68, Issue: 8, Page: 3093-3095
1997
- 11Citations
- 20Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
An improvement to the currently used ac impedance detection method for tip-sample distance control in near-field scanning optical microscopes is described and demonstrated. The output signal of the electronic bridge is increased by a factor of 5000 so that a root-mean-square chip can be used in place of sensitive lock-in detection. It is shown that the signal-to-noise ratio of this new method is high enough to detect 0.07 nm changes in topography. In addition, this modification makes the electronics for the shear force feedback compact and inexpensive. © 1997 American Institute of Physics.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0000040902&origin=inward; http://dx.doi.org/10.1063/1.1148247; https://pubs.aip.org/rsi/article/68/8/3093/459998/A-shear-force-feedback-control-system-for-near; http://aip.scitation.org/doi/10.1063/1.1148247; https://aip.scitation.org/action/captchaChallenge?redirectUrl=https%3A%2F%2Faip.scitation.org%2Fdoi%2F10.1063%2F1.1148247
AIP Publishing
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