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Low temperature ultrahigh vacuum cross-sectional scanning tunneling microscope for luminescence measurements

Review of Scientific Instruments, ISSN: 0034-6748, Vol: 70, Issue: 12, Page: 4595-4599
1999
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  • 29
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Metrics Details

  • Citations
    13
    • Citation Indexes
      13
  • Captures
    29

Article Description

We have constructed a scanning tunneling microscope with simultaneous light collection capabilities in order to investigate the opto-electronic properties of semiconductors. The microscope has in situ sample cleavage mechanism for cross-sectional sample. In order to reach low temperature (4 K), we used a specially designed cryostat. The efficiency of light collection generated in the tip-surface junction was greatly improved by use of a small parabolic mirror with the tip located at its focal point. © 1999 American Institute of Physics.

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