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Fabrication and characterization of heteroepitaxial p-n junction diode composed of wide-gap oxide semiconductors p-ZnRhO/n-Zno

Applied Physics Letters, ISSN: 0003-6951, Vol: 82, Issue: 5, Page: 823-825
2003
  • 121
    Citations
  • 0
    Usage
  • 51
    Captures
  • 0
    Mentions
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Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    121
    • Citation Indexes
      121
  • Captures
    51

Article Description

Fabrication and characterization of heteroepitaxial p-n junction diode composed of wide-gap oxide semiconductors p-ZnRhO/n-ZnO were studied. Polycrystalline ZnRhO was deposited on a ZnO epitaxial layer at room temperature. The results show that the resultant p-n heterojunctions have an abrupt interface and exhibit a distinct rectifying I-V characteristics.

Bibliographic Details

Hiromichi Ohta; Hiroshi Mizoguchi; Masahiro Hirano; Satoru Narushima; Toshio Kamiya; Hideo Hosono

AIP Publishing

Physics and Astronomy

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