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Frequency dependence of the dielectric properties of La-doped Pb(Zr Ti)O thin films

Applied Physics Letters, ISSN: 0003-6951, Vol: 83, Issue: 14, Page: 2892-2894
2003
  • 20
    Citations
  • 0
    Usage
  • 6
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    20
    • Citation Indexes
      20
  • Captures
    6

Article Description

The frequency dependence of the dielectric properties of La-doped Pb(ZrTi)O thin films was studied. a constant phase element with an impedance of Z=A(jω) was introduced into the equivalent circuit. It was suggested that the α might be affected by the density of the domain walls in the film.

Bibliographic Details

Z. G. Zhang; D. P. Chu; B. M. McGregor; P. Migliorato; K. Ohashi; K. Hasegawa; T. Shimoda

AIP Publishing

Physics and Astronomy

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