PlumX Metrics
Embed PlumX Metrics

Morphology and domain pattern of L1 ordered FePt films

Journal of Applied Physics, ISSN: 0021-8979, Vol: 94, Issue: 9, Page: 5672-5677
2003
  • 58
    Citations
  • 0
    Usage
  • 18
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    58
    • Citation Indexes
      58
  • Captures
    18

Article Description

Magnetic force microscope (MFM) was used to characterize the L1 ordered FePt(001) films sputter deposited on MgO(001) substrates. It was found that the morphology varied from isolated particles to continuous films when the nominal thickness (t) was changed. The coercivity showed a marked change at the percolation boundary of t ≅ 45 nm.

Bibliographic Details

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know