PlumX Metrics
Embed PlumX Metrics

Device deformation during low-frequency pulsed operation of high-power diode bars

Applied Physics Letters, ISSN: 0003-6951, Vol: 84, Issue: 18, Page: 3525-3527
2004
  • 16
    Citations
  • 0
    Usage
  • 6
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    16
    • Citation Indexes
      16
  • Captures
    6

Article Description

The thermal tuning properties of cm-bar high-power diode laser arrays were analyzed on a by-emitter scale. The differences that were observed in the overall thermal tuning were assigned to a thermomechanical pressure tuning contribution. The mechanical load such as device experiences were estimated during pulsed operation. The effects indicative of gradual aging were also monitored and analyzed.

Bibliographic Details

Axel Gerhardt; Fritz Weik; Tien QuocTran; Jens W. Tomm; Thomas Elsaesser; Jens Biesenbach; Holger Müntz; Gabriele Seibold; Mark L. Biermann

AIP Publishing

Physics and Astronomy

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know