Tribochemical wear of sodium trisilicate glass at the nanometer size scale
Journal of Applied Physics, ISSN: 0021-8979, Vol: 99, Issue: 2
2006
- 19Citations
- 6Captures
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Article Description
We report measurements of single-asperity wear on sodium trisilicate glass in basic solution using atomic force microscopy (AFM), where the silicon nitride tip was used both to tribologically load and image the surface. Single-asperity micron-square polishing was performed by rastering the AFM tip in a square pattern. More localized, "nano"-machining was performed by drawing the AFM tip back and forth across the substrate in a linear fashion. In both modes, the wear rate gradually slowed during prolonged scanning. Changes in contact stress due to the wear of the AFM tip dramatically affect the observed wear rates. The changes in surface elevation for both the tip and the substrate display the same dependence on true stress and time for the case of square-raster scanning over micron dimensions. In the case of linear reciprocal scanning, conformal wear substantially modifies the rates and morphology of the wear of both the tip and the substrate. © 2006 American Institute of Physics.
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