Fitting a free-form scattering length density profile to reflectivity data using temperature-proportional quenching
Journal of Chemical Physics, ISSN: 0021-9606, Vol: 125, Issue: 24, Page: 244702
2006
- 15Citations
- 17Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations15
- Citation Indexes15
- 15
- CrossRef13
- Captures17
- Readers17
- 17
Article Description
A technique for fitting a free-form scattering length density profile to reflectivity data via least-squares minimization is presented. The approach combines aspects of simulated annealing with a parametrized representation of the scattering length density profile. The ability of the algorithm to accurately recover the scattering length density profile from arbitrary initial parameter values is demonstrated for simulated and experimental data. © 2006 American Institute of Physics.
Bibliographic Details
AIP Publishing
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