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Surface potential mapping on crystalline silicon on glass solar modules

Journal of Applied Physics, ISSN: 0021-8979, Vol: 102, Issue: 2
2007
  • 15
    Citations
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  • 16
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Metrics Details

  • Citations
    15
    • Citation Indexes
      15
  • Captures
    16

Article Description

Thin film solar modules may suffer from internal shunts or other defects like open interconnections. Shunts are detectable in solar modules e.g., by lock-in thermography (LIT). However, since the local potentials in a module are floating, the quantitative interpretation of LIT results is complicated. In crystalline silicon on glass (CSG) thin film silicon solar modules, not only the individual cell potentials may vary, but also the lateral potential within one cell. In this contribution, sequentially contacting surface potential mapping (PM) is proposed for imaging the local surface potential in CSG modules. The measurements were performed in the dark with an applied forward bias and under illumination of the module with an electrical load. The results are displayed in special formats like the cell bias image or the potential deviation image, which are very sensitive to any defects or inhomogeneities in the module. After introducing the experimental technique, PSpice simulations of different defects like shorts and opens in CSG modules are performed. The simulated local potentials are used to construct potential mapping images of different defects under different measurement conditions in different display modes. These simulations are then compared with experimental results obtained on fractions of CSG modules. Characteristic defects can be identified by characteristic PM image structures. We find that PM is a convenient and reliable tool to image inhomogeneities especially in CSG thin film modules. In combination with LIT imaging, this technique allows one to identify any kind of electric inhomogeneities in such modules, which are leading to a reduced performance. The application of this technique to other solar modules is discussed as well. © 2007 American Institute of Physics.

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