Phase-sensitive neutron reflectometry measurements applied in the study of photovoltaic films
Journal of Chemical Physics, ISSN: 0021-9606, Vol: 133, Issue: 7, Page: 074902
2010
- 48Citations
- 62Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Metrics Details
- Citations48
- Citation Indexes48
- 48
- CrossRef38
- Captures62
- Readers62
- 62
Article Description
Due to low charge carrier mobilities in polymer-based solar cells, device performance is dictated by the nanoscale morphology of the active layer components. However, their morphological details are notoriously difficult to distinguish due to the low electron contrast difference between the components. Phase-sensitive neutron reflectivity (PSNR) is uniquely suited to characterize these systems due to the large, natural scattering length density difference between two common device materials, poly(3-hexylthiophene) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM). Using PSNR we find a high concentration of PCBM at the substrate and near but not at the air interface. Herein we discuss the method of applying PSNR to polymer-based solar cells, the results obtained, and an evaluation of its effectiveness. © 2010 American Institute of Physics.
Bibliographic Details
AIP Publishing
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