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Phase coexistence near a morphotropic phase boundary in Sm-doped BiFeO films

Applied Physics Letters, ISSN: 0003-6951, Vol: 97, Issue: 15
2010
  • 81
    Citations
  • 0
    Usage
  • 51
    Captures
  • 0
    Mentions
  • 0
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Metrics Details

  • Citations
    81
    • Citation Indexes
      81
  • Captures
    51

Article Description

We have investigated heteroepitaxial films of Sm-doped BiFeO with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron x-ray diffraction, carried out in a temperature range of 25 to 700 °C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO -like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films exhibiting anisotropic misfit between film and substrate. Additionally, thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in thinner films. © 2010 American Institute of Physics.

Bibliographic Details

S. B. Emery; F. J. Rueckert; S. P. Alpay; B. O. Wells; C. J. Cheng; V. Nagarajan; D. Kan; I. Takeuchi

AIP Publishing

Physics and Astronomy

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