Phase coexistence near a morphotropic phase boundary in Sm-doped BiFeO films
Applied Physics Letters, ISSN: 0003-6951, Vol: 97, Issue: 15
2010
- 81Citations
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Article Description
We have investigated heteroepitaxial films of Sm-doped BiFeO with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron x-ray diffraction, carried out in a temperature range of 25 to 700 °C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO -like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films exhibiting anisotropic misfit between film and substrate. Additionally, thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in thinner films. © 2010 American Institute of Physics.
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