Concurrent presence of unipolar and bipolar resistive switching phenomena in pnictogen oxide SbO films
Journal of Applied Physics, ISSN: 0021-8979, Vol: 112, Issue: 11
2012
- 7Citations
- 12Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
The concurrent presence of unipolar resistive switching (URS) and bipolar resistive switching (BRS) characteristics of the Sb/SbO /Pt structure were examined. It was discovered that the BRS phenomenon was driven by the abnormal reset process during URS cycles which was induced by the rupture and recovery of the conducting filament (CF) in the localized region near the anode. The electrical conduction behavior in the high resistance state of URS and BRS was explained by the Schottky emission and space-charge-limited current mechanism, meaning that the URS and BRS phenomena are induced by the extent of reoxidaton and reduction regarding the local CF-ruptured region. © 2012 American Institute of Physics.
Bibliographic Details
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know