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Studies on electronic structures of semiconductors by atomic force microscopy

Journal of Chemical Physics, ISSN: 0021-9606, Vol: 110, Issue: 24, Page: 12116-12121
1999
  • 6
    Citations
  • 0
    Usage
  • 7
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    6
    • Citation Indexes
      5
    • Patent Family Citations
      1
      • Patent Families
        1
  • Captures
    7

Article Description

Electron spectroscopy by charge-transfer force measurement is demonstrated. Under this method, the attractive forces between a semiconductor and a metal-coated tip are measured using an atomic force microscope to reveal the electronic structure of the semiconductor. A charge transfer model is developed to explain the force spectra, which holds information on energy gap, electron affinity, ionization energy and density of states. The method provides information on occupied and unoccupied states simultaneously with high spatial resolution for conductive and nonconductive samples alike.

Bibliographic Details

Masaaki Shimizu; Hiroyuki Watanabe; Kazunori Anazawa; Tomoko Miyahara; Chikara Manabe

AIP Publishing

Physics and Astronomy; Chemistry

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