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Investigation of ion beam induced nanopattern formation near the threshold energy

Applied Physics Letters, ISSN: 0003-6951, Vol: 103, Issue: 16
2013
  • 18
    Citations
  • 0
    Usage
  • 10
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    18
    • Citation Indexes
      18
  • Captures
    10

Article Description

The nanoscale ripple formation on mica surface is studied at off-normal ion incidence angles θ under Ar bombardment at energies E close to or below the threshold energy for physical sputtering. A phase diagram for domains of pattern formation is presented as a function of θ and E, which shows the stability/instability bifurcation angle close to 40°. The instability grows as ripple-like structures at lower angles, while at grazing angles the pattern emerges as dense array of needles. The results support the pure mass redistribution based paradigm for surface patterning as the erosion due to sputtering essentially tends to zero. © 2013 AIP Publishing LLC.

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