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Thermoelastic study of nanolayered structures using time-resolved X-ray diffraction at high repetition rate

Applied Physics Letters, ISSN: 0003-6951, Vol: 104, Issue: 2
2014
  • 21
    Citations
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  • 22
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Metrics Details

  • Citations
    21
    • Citation Indexes
      21
  • Captures
    22

Article Description

We investigate the thermoelastic response of a nanolayered sample composed of a metallic SrRuO electrode sandwiched between a ferroelectric Pb(ZrTi)O film with negative thermal expansion and a SrTiO substrate. SrRuO is rapidly heated by fs-laser pulses with 208 kHz repetition rate. Diffraction of X-ray pulses derived from a synchrotron measures the transient out-of-plane lattice constant c of all three materials simultaneously from 120 ps to 5 μs with a relative accuracy up to Δc/c = 10. The in-plane propagation of sound is essential for understanding the delayed out-of-plane compression of Pb(ZrTi)O. © 2014 AIP Publishing LLC.

Bibliographic Details

Schick, D.; Gaal, P.; Bargheer, M.; Shayduk, R.; Navirian, H. A.; Leitenberger, W.

AIP Publishing

Physics and Astronomy

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