Thermoelastic study of nanolayered structures using time-resolved X-ray diffraction at high repetition rate
Applied Physics Letters, ISSN: 0003-6951, Vol: 104, Issue: 2
2014
- 21Citations
- 22Captures
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Article Description
We investigate the thermoelastic response of a nanolayered sample composed of a metallic SrRuO electrode sandwiched between a ferroelectric Pb(ZrTi)O film with negative thermal expansion and a SrTiO substrate. SrRuO is rapidly heated by fs-laser pulses with 208 kHz repetition rate. Diffraction of X-ray pulses derived from a synchrotron measures the transient out-of-plane lattice constant c of all three materials simultaneously from 120 ps to 5 μs with a relative accuracy up to Δc/c = 10. The in-plane propagation of sound is essential for understanding the delayed out-of-plane compression of Pb(ZrTi)O. © 2014 AIP Publishing LLC.
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