Transient thermal imaging of a vertical cavity surface-emitting laser using thermoreflectance microscopy
Journal of Applied Physics, ISSN: 1089-7550, Vol: 119, Issue: 4
2016
- 7Citations
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Article Description
Thermal transient response at the surface of a Vertical Cavity Surface-emitting Laser (VCSEL) is measured under operating conditions using a thermoreflectance imaging technique. From the transient curve, a thermal time constant of (9.7 ± 0.5) μs is obtained for the device surface in response to a 40 μs heating pulse. A cross-plane thermal diffusivity of the order of 2 × 10 m/s has been deduced from both the experimental data and heat transfer modeling. This reduced thermal diffusivity compared to the bulk is attributed to the enhanced phonon scattering at the boundaries of the VCSEL's multi-layered structure.
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