Sequencing and identification TOF-SIMS analysis on D9 alloy
AIP Conference Proceedings, ISSN: 1551-7616, Vol: 2518
2022
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Conference Paper Description
We present a method for the clear identification of materials using a TOF-SIMS. TOF-SIMS method whereby the accurate and reproducible chemical depth distributions of atomic and molecular surface analysis identification on the nanometer scale. TOF-SIMS depth profiles was demonstrated with the PHI TRIFT V nano TOF using a Ga+ cluster LMIG to observe the structure of a spontaneously identified elements of D9 alloy. The high sensitivity of nano TOF's TRIFT analyzer, combined with new ion beam Technologies for nondestructive molecular depth profiling, enables 2D visualization of molecular structures compared with depth profile for PA techniques.
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