Ambient formation of high pressure AgSiO and non-stoichiometric AgAl alloy under confinement

We report results of Field Emission Scanning Electron Microscopy (FESEM), Energy Dispersive Analysis of X-rays (EDAX), X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectivity (XRR), and X-ray Diffraction (XRD) and residual stress measurement studies of Ag-silica composite films on Al(001) co-deposited from precursors and spin-coated at different frequencies under ambient conditions. FESEM and EDAX show Ag nanoparticle formation, and XRD, XPS, and XRR show AgAl alloy and Ag-rich silicate AgSiO formation in all samples. The alloy is non-stoichiometric and non-equilibrium, while the silicate forms at high oxygen pressure. XRR shows the presence of three layers, nanoparticles on top, silicate in the middle, and alloy at the bottom, on an Ag-doped Al substrate. Film thickness decreases exponentially with frequency. Individual layers increase in crystal domain size with a frequency of 3000 rpm when the silicate layer thins below unit cell thickness and the growth has a two-dimensional preference. Our results suggest total confinement by film thinning and local confinement from the Ag nanolayer. Residual stress measurements on the films deposited at 500 and 5000 rpms show a gradual increase in the tensile stress. The increase in spinning frequency reveals the formation of high pressure ambience.