Influence of ionic contaminations on SSFLCD addressing
Ferroelectrics, ISSN: 0015-0193, Vol: 178, Issue: 1-4, Page: 1-16
1996
- 7Citations
- 1Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
In this paper a theoretical SSFLCD switching model is presented which focuses on the calculation of the internal electric field. Using this model we can investigate the joint dynamics of the FLC reorientation and charge carrier transport inside the LC-layer with or without applied voltage. We give some results on charge separation and addressing problems.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0029724481&origin=inward; http://dx.doi.org/10.1080/00150199608008343; http://www.tandfonline.com/doi/abs/10.1080/00150199608008343; http://www.tandfonline.com/doi/pdf/10.1080/00150199608008343; https://dx.doi.org/10.1080/00150199608008343; https://www.tandfonline.com/doi/abs/10.1080/00150199608008343
Informa UK Limited
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