A simple physical model of hexagonal patterns in a Townsend discharge with a semiconductor cathode
Journal of Physics D: Applied Physics, ISSN: 0022-3727, Vol: 43, Issue: 25
2010
- 20Citations
- 7Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
This paper explains the observed effect of self-organization in a dc driven planar gas discharge-semiconductor system resulting in a hexagonal current pattern under cryogenic conditions. It is shown that the electric field redistribution usually causing a falling current-voltage characteristic (CVC) of the Townsend discharge and the discharge instability cannot provide the formation of the hexagonal pattern. Another mechanism is proposed which gives a necessary, high negative slope of the CVC under cryogenic conditions. This is a well-known thermal mechanism. Due to Joule heat release gas is heated and expands; hence, a lower field and voltage are required to sustain the discharge at a given current. Simple approximate equations describing non-stationary spatially inhomogeneous states in the gas discharge-semiconductor system are derived from physical considerations. The numerical integration of the obtained equations with a realistic parameter set gives the hexagonal current pattern. By simplifying these equations, we found analytically the current and the discharge voltage distributions of the hexagonal type and a simple formula for the distance between adjacent current filaments. The analytical solution allows one to investigate the roles of different factors and extract from experiment the negative differential resistance of the discharge, which is the main parameter in the problem of the discharge instability and the current structure formation. © 2010 IOP Publishing Ltd.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77953554805&origin=inward; http://dx.doi.org/10.1088/0022-3727/43/25/255204; https://iopscience.iop.org/article/10.1088/0022-3727/43/25/255204; https://dx.doi.org/10.1088/0022-3727/43/25/255204; https://validate.perfdrive.com/fb803c746e9148689b3984a31fccd902/?ssa=54f1ac53-1a1e-4615-aab8-1494e431ab0f&ssb=53212221535&ssc=https%3A%2F%2Fiopscience.iop.org%2Farticle%2F10.1088%2F0022-3727%2F43%2F25%2F255204&ssi=022d69ea-8427-4652-ba68-f74193fe1ca3&ssk=support@shieldsquare.com&ssm=50149203269293273147404315967074132&ssn=ea617a275a8a3cd92a9ad5107dc0d72d9298e7e44089-5b4c-4bba-9769e9&sso=5607980e-62ddb6055d96f726e36d9b11594288bbea90e27460203c6d&ssp=84742418401722117827172237159771603&ssq=81661330904020731891796580525151190312902&ssr=NTIuMy4yMTcuMjU0&sst=com.plumanalytics&ssu=&ssv=&ssw=&ssx=eyJyZCI6ImlvcC5vcmciLCJfX3V6bWYiOiI3ZjYwMDA3NmNmYmIwZC1hOTY5LTQwMjItYWM3My04NjU0NDg0NTczMTgxNzIyMTk2NTgwNDk0MTEyNDYwMDc1LTNjM2Y2NzBjM2U2MGM0YjcxNDc0MCIsInV6bXgiOiI3ZjkwMDA1ZmViNjE3Ny05MmVkLTRmNTYtOGZlMS01OTlkOWM5MmM0MTUzLTE3MjIxOTY1ODA0OTQxMTI0NjAwNzUtMTZjODI0NTM4MjZhOWQ1YzE0NzQwIn0=
IOP Publishing
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know