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Hot-phonon lifetime in a modulation-doped AlInAs/GaInAs/AlInAs/InP

Semiconductor Science and Technology, ISSN: 0268-1242, Vol: 20, Issue: 2, Page: 109-114
2005
  • 21
    Citations
  • 0
    Usage
  • 7
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    21
    • Citation Indexes
      21
  • Captures
    7

Article Description

The experimental dependence of microwave noise temperature on supplied electric power is used to study hot phonons in an InP-based modulation-doped InAlAs/InGa As/InGaAs/InAl As heterostructure with a two-dimensional electron gas channel (n = 2.3 × 10 cm). The effective hot-phonon temperature is extracted for two-subband and six-subband models treated in the electron-temperature approximation. The estimated value for the hot-phonon lifetime with respect to the longitudinal optical phonon conversion into other vibration modes is (0.9 ± 0.3) ps at room temperature.

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