Surface morphology and topography evolution of soda-lime silica glass after 1.0 MeV Si ion bombardment
Physica Scripta, ISSN: 1402-4896, Vol: 98, Issue: 10
2023
- 1Citations
- 2Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Surface pattern formation on soda-lime silica glass by 1 MeV Si ion irradiation impinging at an angle of 70° with respect to the surface normal has been studied. Modification of surfaces were analyzed for total ion fluences applied between 1 × 10 17 up to 4 × 10 17 ions/cm. The surface morphology and topography were studied by scanning electron microscopy (SEM), and atomic force microscopy (AFM). These surface techniques enabled the determination of roughness, characteristic wavelengths, and correlation lengths. In addition, electron dispersive spectroscopy (EDS) scans were applied on the surface topography to study the variation of the Si content on the obtained surface patterns. From the measurement of these variables, linear and non-linear regimes were established. At linear regime, the surface morphology develops from an initial flat surface giving rise to ripples for fluences up to 1.4 × 10 17 ions/cm. As the ion bombardment continues surface evolve into wrinkles finalizing at cellular-like structures, growing under an anomalous scaling process. The EDS scans indicate the presence of shadowing effects. The morphological changes observed can be explained in terms of a combination of thermal mass diffusion and geometrical factors during ion irradiation, including shadowing and subsequent (secondary) surface erosion effects adapted to few MeV energies.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85173622716&origin=inward; http://dx.doi.org/10.1088/1402-4896/acf7fe; https://iopscience.iop.org/article/10.1088/1402-4896/acf7fe; https://dx.doi.org/10.1088/1402-4896/acf7fe; https://validate.perfdrive.com/fb803c746e9148689b3984a31fccd902/?ssa=6fc40098-cc97-4750-9f33-6b4af6572721&ssb=03401223353&ssc=https%3A%2F%2Fiopscience.iop.org%2Farticle%2F10.1088%2F1402-4896%2Facf7fe&ssi=0c2c568b-8427-4a1a-83d7-28da7e657156&ssk=support@shieldsquare.com&ssm=07686975400875486119863632672886703&ssn=7ed3f47d1000b13d7d109643dad8b9390c74a0463a4f-009b-47ce-9d725d&sso=5d0f11c8-61d03bb24b4fec26eda79e7ff1775a983ab833971dda6bd9&ssp=94363245341721806704172203263898017&ssq=92544255101522063635844350004119914986185&ssr=NTIuMy4yMTcuMjU0&sst=com.plumanalytics&ssu=&ssv=&ssw=&ssx=eyJyZCI6ImlvcC5vcmciLCJ1em14IjoiN2Y5MDAwNzM4YjQ1MzYtZjkxMi00MTkwLWE3OGEtODU0MGY0NmY1NDFiNC0xNzIxODQ0MzUwOTAyMjA2NjY0NTg0LWFmNTdmMzljNGY1MmI2YWUxMTk4MyIsIl9fdXptZiI6IjdmNjAwMDIyNjFjZjE3LWQ4Y2ItNGMyYi1hZDdmLWZiYzA5NTcxNjNiZjE3MjE4NDQzNTA5MDIyMDY2NjQ1ODQtMjBlMmY0OGMyZmJkZWE2YzExOTgzIn0=
IOP Publishing
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know