UV-converted heterogeneous wettability surface for the realization of printed micro-scale conductive circuits
Flexible and Printed Electronics, ISSN: 2058-8585, Vol: 8, Issue: 3
2023
- 2Citations
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations2
- Citation Indexes2
Article Description
Achieving high precision in the fabrication of electronic circuits through additive manufacturing requires breaking the resolution limit of traditional printing processes. To address this challenge, we have developed a novel approach that involves preparing a heterogeneous wetting surface using a light-sensitive NBE-acrylate resin. By creating differences in surface energy on the substrate, we can limit the spread of the ink and surpass the limitations of conventional processes, achieving a printing resolution of 5 μm. The NBE-acrylate resin can be cross-linked under white LED light illumination (with λ > 400 nm) to yield a hydrophobic surface, which can be converted to a hydrophilic surface by UV light illumination (λ = 254 nm). The photochemical reaction of the NBE-acrylate resin under different light irradiation was confirmed by Fourier transform infrared spectroscopy (FTIR) and atomic force microscope (AFM) microforce measurements. In combination with a photomask, patterned heterogeneous wettability surfaces were prepared, which can be utilized for printing precision electronic circuits. Micrometer-scale printed circuits with a low line-to-space (L/S) of 5/50 and 10/10 μm were successfully achieved by optimizing the ink formulation, which is significantly beyond the printing resolution. In the end, fully printed thin film transistor arrays based on semi-conducting carbon nanotubes were achieved, which showed higher charge carrier mobilities of 1.89-4.31 cm s V depending on the channel width, demonstrating the application of this precision printed technique.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85174241974&origin=inward; http://dx.doi.org/10.1088/2058-8585/acf772; https://iopscience.iop.org/article/10.1088/2058-8585/acf772; https://dx.doi.org/10.1088/2058-8585/acf772; https://validate.perfdrive.com/fb803c746e9148689b3984a31fccd902/?ssa=5aaec5e2-d351-4a73-9c15-36d0bcaa222c&ssb=33124276095&ssc=https%3A%2F%2Fiopscience.iop.org%2Farticle%2F10.1088%2F2058-8585%2Facf772&ssi=ca29223f-8427-46e4-abcf-d289f6174df9&ssk=support@shieldsquare.com&ssm=3697003358854501922518041911653199&ssn=7f55fb825be9c966df4eaacf685eec3d5ce61d717baf-41c9-4be8-bf1fd7&sso=c08e62e5-8edfa45a3534cecce179989a00cbde16c78e68c4edf56b12&ssp=88799659441722426380172240685878325&ssq=45773478678650970585249886453751716463279&ssr=NTIuMy4yMTcuMjU0&sst=com.plumanalytics&ssu=&ssv=&ssw=&ssx=eyJfX3V6bWYiOiI3ZjYwMDBhYzc1Mjc3MS00NDY5LTQ1YzEtYjIyZC01ZTMxN2I4YmJmMzUxNzIyNDQ5ODg2MzE1MzY5MDAzMDgtMDljN2Q0YzhlZGYyYjcyZDIyNTEiLCJ1em14IjoiN2Y5MDAwNjBhYjM4MDQtMjgyMi00ODE2LTljOGQtMDM2ZThjYzNlOTMyMi0xNzIyNDQ5ODg2MzE1MzY5MDAzMDgtMTU4NDkzYmJmZWQwOWMyODIyNTEiLCJyZCI6ImlvcC5vcmcifQ==
IOP Publishing
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know