Critical test of the diffraction model in amorphous and disordered metals
Physical Review B, ISSN: 0163-1829, Vol: 17, Issue: 12, Page: 4652-4659
1978
- 53Citations
- 7Captures
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Article Description
The transport properties of amorphous metals below their Debye temperatures are examined within the framework of the diffraction model. The electrical resistivity is predicted to exhibit the following features: (i) All curves deviate from their T=0° K values as +T2; (ii) Negative temperature coefficients of resistivity (TCR) occur at T for KKp, where Kp is the position of the principal peak in the structure factor a(K) and K=2kF. Positive TCR occur at all T for K outside the vicinity of Kp, i.e., to the left- and right-hand sides of Kp; (iii) Small maxima in (of the order of tenths of a percent) are seen for KKp. The position of the maximum shifts to lower temperatures as KKp. The largest maximum occurs for the nearly flat curve; (iv) The amplitude of the variations of, and the size of the maxima are sensitive to and the sharpness of the main peak in a(K); (v) For fixed, the positions of the maxima in generally approach as the main peak in a(K) becomes smaller; (vi) The curves which display only positive TCR are generally S shaped; (vii) The electron-to-atom ratio for negative TCR is estimated to range from 1.3z to 3z. The predictions are compared with experimental findings in a variety of amorphous alloys. The agreement is excellent. The question of breakdown of the diffraction model is discussed; some of the apparent paradoxes seen in high-resistivity metals are resolved through a redefinition of saturation. The implications of these results for disordered and liquid metals are also discussed. © 1978 The American Physical Society.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=4243267218&origin=inward; http://dx.doi.org/10.1103/physrevb.17.4652; https://link.aps.org/doi/10.1103/PhysRevB.17.4652; http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.17.4652/fulltext; http://link.aps.org/article/10.1103/PhysRevB.17.4652
American Physical Society (APS)
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