Angle-of-incidence dependence of photoemission of a localized electron from a jellium solid
Physical Review Letters, ISSN: 0031-9007, Vol: 36, Issue: 4, Page: 234-236
1976
- 1Citations
- 2Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations1
- Citation Indexes1
- CrossRef1
- Captures2
- Readers2
Article Description
We show via a calculation for a localized electron in a jellium solid that an escape-cone mechanism accounts for a significant component of the peak seen by Rowe and Christman in photoyield data as a function of angle of incidence for Ar embedded in Ge(111) and Si(111) surfaces. © 1976 The American Physical Society.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=35949033760&origin=inward; http://dx.doi.org/10.1103/physrevlett.36.234; https://link.aps.org/doi/10.1103/PhysRevLett.36.234; http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.36.234/fulltext; http://link.aps.org/article/10.1103/PhysRevLett.36.234
American Physical Society (APS)
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