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Use of linear scans to obtain |F| and the integrated intensity

Journal of Applied Crystallography, ISSN: 0021-8898, Vol: 43, Issue: 5 PART 1, Page: 1121-1123
2010
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Article Description

An alternative method for determining the structure factor of a Bragg reflection is described. For broad reflections, the structure factor can be obtained from linear scans through the reflection in reciprocal space. The best known geometry corrections, i.e. Lorentz, polarization and area (volume) factors, are properly taken into account. In modern diffractometers, scans in reciprocal space are standard operations controlled by the diffractometer software program. The necessary corrections and diffractometer slit settings for the use of the new method are described. © 2010 International Union of Crystallography Printed in Singapore-all rights reserved.

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