Use of linear scans to obtain |F| and the integrated intensity
Journal of Applied Crystallography, ISSN: 0021-8898, Vol: 43, Issue: 5 PART 1, Page: 1121-1123
2010
- 2Citations
- 2Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Article Description
An alternative method for determining the structure factor of a Bragg reflection is described. For broad reflections, the structure factor can be obtained from linear scans through the reflection in reciprocal space. The best known geometry corrections, i.e. Lorentz, polarization and area (volume) factors, are properly taken into account. In modern diffractometers, scans in reciprocal space are standard operations controlled by the diffractometer software program. The necessary corrections and diffractometer slit settings for the use of the new method are described. © 2010 International Union of Crystallography Printed in Singapore-all rights reserved.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=77957358376&origin=inward; http://dx.doi.org/10.1107/s0021889810022491; https://journals.iucr.org/paper?S0021889810022491; http://scripts.iucr.org/cgi-bin/paper?S0021889810022491; http://journals.iucr.org/j/issues/2010/05/01/ko5115/ko5115.pdf; https://dx.doi.org/10.1107/s0021889810022491
International Union of Crystallography (IUCr)
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