Resonant X-ray scattering studies of epitaxial complex oxide thin films
Journal of Applied Crystallography, ISSN: 0021-8898, Vol: 46, Issue: 1, Page: 76-87
2013
- 7Citations
- 14Captures
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Article Description
Resonant anomalous X-ray reflectivity (RAXR) is a powerful technique for measuring element-specific distribution profiles across surfaces and buried interfaces. Here, the RAXR technique is applied to characterize a complex oxide heterostructure, LaSrCoFe O, on NdGaO, and the effects of data sampling and model-dependent fitting procedures on the extracted elemental distribution profile are evaluated. The strontium profile through a 3.5 nm-thick film at 973 K and at an oxygen partial pressure of 150 Torr (1 Torr = 133.32 Pa) was determined from the measured RAXR spectra. The results demonstrate that in situ RAXR measurements can provide key insights into temperature- and environment-dependent elemental segregation processes, relevant, for example, in assessing the cathode performance of solid oxide fuel cells. © 2013 International Union of Crystallography.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84872706437&origin=inward; http://dx.doi.org/10.1107/s0021889812047620; http://scripts.iucr.org/cgi-bin/paper?S0021889812047620; http://journals.iucr.org/j/issues/2013/01/00/to5020/to5020.pdf; https://journals.iucr.org/paper?S0021889812047620; https://dx.doi.org/10.1107/s0021889812047620
International Union of Crystallography (IUCr)
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