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Effect of gate recessing on linearity characteristics of AlGaN/GaN HEMTs

Device Research Conference - Conference Digest, DRC, ISSN: 1548-3770, Page: 33-34
2004
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Conference Paper Description

The planar and recessed gate devices were fabricated and compared for their linearity characteristics. AlGaN/GaN heterostructures were formed using a 290 Å thick Al 0.78N barrier layer on sapphire substrate. Gate recessing has been proven to be a viable solution to improve device linearity characteristics. It is observed that further optimization of gate recessing may results in higher efficiency operation while maintaining low distortion level.

Bibliographic Details

A. Chini; D. Buttari; R. Coffie; L. Shen; T. Palacios; S. Heikman; A. Chakraborty; S. Keller; U. K. Mishra

Institute of Electrical and Electronics Engineers (IEEE)

Engineering

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