Statistical approach to the EMI modeling of large asks by a single noise-current source
Electrical Performance of Electronic Packaging, Page: 345-348
2003
- 7Citations
- 67Usage
- 3Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations7
- Citation Indexes7
- CrossRef5
- Usage67
- Downloads62
- Abstract Views5
- Captures3
- Readers3
Conference Paper Description
Large and complex ASICs are source of propagating noise inside the powerbns planes. A lumped noise source model is proposed and validated by means of a statistics based method.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=59049093588&origin=inward; http://dx.doi.org/10.1109/epep.2003.1250065; http://ieeexplore.ieee.org/document/1250065/; http://xplorestaging.ieee.org/ielx5/8843/27977/01250065.pdf?arnumber=1250065; https://scholarsmine.mst.edu/ele_comeng_facwork/1892; https://scholarsmine.mst.edu/cgi/viewcontent.cgi?article=2891&context=ele_comeng_facwork
Institute of Electrical and Electronics Engineers (IEEE)
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