PlumX Metrics
Embed PlumX Metrics

Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements

Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281, Vol: 2015-July, Page: 1532-1536
2015
  • 4
    Citations
  • 0
    Usage
  • 3
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

Conference Paper Description

The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).

Bibliographic Details

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know