Metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements
Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281, Vol: 2015-July, Page: 1532-1536
2015
- 4Citations
- 3Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Conference Paper Description
The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging requirements, in particular for Common Mode Rejection Ratio (CMRR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).
Bibliographic Details
Institute of Electrical and Electronics Engineers (IEEE)
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know