The KLOE-2 cylindrical GEM inner tracker: Detector operation, calibration and performance
2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016, Vol: 2017-January, Page: 1-5
2017
- 4Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Captures4
- Readers4
Conference Paper Description
KLOE-2 at the ee DAφNE φ-factory is the main experiment of the INFN Frascati National Laboratories (LNF) and is the first high-energy experiment using the GEM technology with a cylindrical geometry, a novel idea that was developed at LNF exploiting the kapton properties to build a light and compact tracking system. Four concentric cylindrical triple-GEM detectors, for a total material budget below 2% of the radiation length X, are inserted around the interaction region and before the inner wall of the pre-existing KLOE Drift Chamber, at distances from 130 mm to 205 mm. For this project, state-of-the-art solutions have been expressly developed or tuned: single-mask GEM etching, multi-layer XV patterned readout circuit, PEEK spacer grid, GASTONE front-end board, a custom 64-channel ASIC with digital output, and the Global Interface Board for data collection, with a configurable FPGA architecture and Gigabit Ethernet. The dedicated XV strips patterned readout allows space coordinates to be reconstructed. Alignment and calibration of a cylindrical GEM detector was never done before and represents one of the challenging activities of the experiment. During 2015 both KLOE-2 and DAPHNE successfully demonstrated the feasibility of a long term acquisition program with the first data taking campaign, started in November 2014 and ended in July 2015 with 1 fb integrated luminosity. The second new data taking campaign started in September 2015 and KLOE-2 is presently taking data. The Inner Tracker detector operation, calibration and performance will be presented. Preliminary results obtained with cosmic-ray muons and Bhabha scattering events are within expectations for the Inner Tracker resolution.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85041701095&origin=inward; http://dx.doi.org/10.1109/nssmic.2016.8069913; https://ieeexplore.ieee.org/document/8069913/; http://xplorestaging.ieee.org/ielx7/8062961/8069358/08069913.pdf?arnumber=8069913; http://ieeexplore.ieee.org/document/8069913/
Institute of Electrical and Electronics Engineers (IEEE)
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know